The present disclosure provides a thermomechanical actuator and a cleaning system implementing the thermomechanical actuator. The thermomechanical actuator includes a solar heat collector (SHC) housing shape memory alloy springs connected between a piston movably disposed therein and one end of the SHC. A cable extending from the piston through an opposite end of the SHC is connected to a bias load that develops returning force on the springs. In presence of solar radiation, the springs contract and cause linear movement of the piston in a direction of contraction and, in absence of the solar radiation, the springs expand and cause linear movement of the piston in direction of expansion. Useful power and work is extracted in form of the cleaning system from such linear movement of the piston.

• 출원번호 : 18739506
• 출원인 : Imam Abdulrahman Bin Faisal University
• 특허번호 :
• IPC : F03G-007/06(2006.01);F24S-020/60(2006.01);F24S-030/00(2006.01);F24S-040/20(2006.01);H02S-040/10(2006.01);

본 발명은 피폭선량 예측 및 관리 시스템에 관한 것으로서, 구체적으로는 원자력발전소의 방사선 작업에서 작업자의 피폭선량을 작업 전에 미리 예측할 수 있도록, 작업장소와 작업자를 모델링하여 시나리오에 반영함으로써, 시뮬레이션을 미리 구현해 볼 수 있도록 하는 피폭선량 예측 및 관리 시스템에 관한 것이다.

• 출원번호 : 10-2024-0075302
• 출원인 : 시버리솔루션스(주);한국전력기술 주식회사;
• 특허번호 : 10-2706651-0000
• IPC : G01T-001/161;G01T-001/02;G06F-030/20;

• 출원번호 : 24181026.6
• 출원인 : Dornier Nuclear Services GmbH
• 특허번호 :
• IPC : G21F-009/30(2006.01);G21F-009/28(2006.01);B09B-003/00(2022.01);B09B-003/40(2022.01);C22B-007/00(2006.01);

The invention relates to an apparatus (1) for examining optical properties of surfaces, comprising a first radiation device (2) which is suitable and intended for irradiating radiation in an irradiation direction (R1), characterised by a first irradiation angle (a1), onto the surface to be examined, and comprising a first radiation detection device (12) which is suitable and intended for detecting radiation, and in particular scattered radiation, emitted at a first emission angle (b1) from the surface (10) to be examined in response to the irradiated radiation, and comprising a second radiation detection device (14) which is suitable and intended for detecting radiation emitted at a second emission angle (b2) from the surface (10) to be examined in response to the irradiated radiation, characterised in that the apparatus (1) has a second radiation device (4) which is suitable and intended for irradiating radiation in a second irradiation direction (R2), characterised by a second irradiation angle (a2), onto the surface to be examined, wherein the first irradiation angle (a1) and the second irradiation angle (a2) are substantially mirror-inverted in relation to a direction perpendicular to the surface to be examined.

• 출원번호 : EP2024/065960
• 출원인 : BYK-GARDNER GMBH
• 특허번호 :
• IPC : G01N-021/31(2006.01);G01J-003/50(2006.01);G01N-021/57(2006.01);G01N-021/47(2006.01);G01N-021/84(2006.01);

[Problem] To provide a radiation treatment assistance device, a radiation treatment assistance program, and a radiation treatment system capable of monitoring, in real time during radiation exposure, that a tumor moving due to respiration, heart movement, intestinal peristalsis, or the like remains in a planning target volume irradiated with a therapeutic radiation beam during MR-guided online-adaptive radiotherapy. [Solution] The present invention is provided with: a magnetic resonance image acquisition unit that acquires magnetic resonance image data of a region including the planning target volume of a therapeutic radiation beam; and an image synthesis unit that synthesizes preset contour image data for the magnetic resonance image data. The magnetic resonance image acquisition unit acquires first magnetic resonance image data that is a magnetic resonance image when the radiation is being radiated, and second magnetic resonance image data that is a magnetic resonance image when the radiation is not being radiated. The image synthesis unit synthesizes the second magnetic resonance image data and contour image data including image data of the contours of a gross tumor volume and image data of the contours of the planning target volume.

• 출원번호 : JP2024/020982
• 출원인 : UNIVERSITY PUBLIC CORPORATION OSAKA
• 특허번호 :
• IPC : A61B-005/055(2006.01)

Provided are an information processing apparatus, an information processing method, and a program that can extract a detection target region from a transmission image of an examination object obtained with radiation and can optimize a workflow for a detection result of the detection target region. An information processing apparatus includes a processor, in which the processor acquires a transmission image of an examination object obtained with radiation, extracts a detection target region from the transmission image, acquires a feature value for the extracted detection target region, and determines a priority of the detection target region based on the feature value.

• 출원번호 : 18738416
• 출원인 : FUJIFILM Corporation
• 특허번호 :
• IPC : G06V-010/25(2006.01);G06T-007/50(2006.01);G06V-010/44(2006.01);

One or more example embodiments relates to a method for reconstructing virtual monoenergetic images comprising acquiring spectral CT data at at least two different average radiation energies; reconstructing virtual monoenergetic images (VMIs) from the CT data, a respective VMI energy of the VMIs varies along the patient longitudinal axis, a 3D image of at least a part of the patient being based on the VMIs; and outputting the virtual monoenergetic images. One or more example embodiments further relates to a corresponding device, as well as to a control facility and a CT system.

• 출원번호 : 18738456
• 출원인 : Siemens Healthineers AG
• 특허번호 :
• IPC : G06T-015/00(2006.01);A61B-006/00(2006.01);A61B-006/03(2006.01);A61B-006/50(2006.01);G06T-007/00(2006.01);G06T-007/10(2006.01);

A verification process and a verification device verify a gas measuring device (100). A radiation source (1) emits radiation into a measurement chamber (2), the intensity of the emitted radiation being described by an input signal xRef(t), xÜb(t). A detector (4) generates an output signal yRef(t), yÜb(t) depending on the intensity of radiation in the measurement chamber. The gas measuring device is assumed to be intact in a reference period (Ref_ZR). The objective is to check whether it is also intact in a verification period (Üb_ZR). In both periods, an indicator of system behavior of a system model is calculated in each case. This system model is excited with the input signal and provides the measured output signal in response to the excitation. The two system behavior indicators are compared with each other. Depending on this comparison, measuring device status information in the verification period is derived.

• 출원번호 : 18738151
• 출원인 : DRAACK, Sebastian
• 특허번호 :
• IPC : G01N-023/06(2006.01)

A gas measuring device (100) and a gas measuring process analyze a gas sample (Gp) from a spatial area (B) for target gas (Zg). A measurement chamber (2) is filled with the gas sample and a reference chamber (3) is filled with a reference gas (Rg). A radiation source (1) emits radiation eW, s(t) into the measurement chamber and the reference chamber. The target gas attenuates the radiation. A measurement detector (4) measures a measurement signal y(t), a reference detector (5) measures a reference signal x(t). Both signals correlate with the radiation intensity in the respective chamber. A system behavior G(s) of a system model is calculated that is excited with the reference signal x(t) as the input signal and generates the measurement signal y(t) as the output signal in response. Information (Erg) about the target gases in the gas sample is determined by evaluating the system behavior.

• 출원번호 : 18738367
• 출원인 : DRAACK, Sebastian
• 특허번호 :
• IPC : G01N-021/3504(2006.01);G01N-021/17(2006.01);G01N-029/032(2006.01);G01N-029/46(2006.01);

The invention relates to a method for producing a plurality of semiconductor laser chips, comprising the following steps: - providing an epitaxial semiconductor layer sequence (2) having an active layer (5), which is configured to generate electromagnetic radiation, on a growth substrate (1), wherein the active layer (5) is arranged between a first semiconductor layer (3) and a second semiconductor layer (4), - generating a photonic layer (9) with a photonic crystal (10) in the first/second semiconductor layer (3, 4), - generating recesses (7) starting from a main face of the epitaxial semiconductor layer sequence (2), wherein the recesses (7) penetrate the active layer (5), - applying a plurality of first contact points (13) in the recesses (7), said contact points electrically contacting the first semiconductor layer (3), and applying a plurality of second contact points (14) over or on the first main face of the epitaxial semiconductor layer sequence (2), said contact points electrically contacting the second semiconductor layer (4). The invention also relates to a semiconductor laser chip, to a method for producing a laser component and to a laser component.

• 출원번호 : EP2024/065901
• 출원인 : AMS-OSRAM INTERNATIONAL GMBH
• 특허번호 :
• IPC : H01S-005/0234(2021.01);H01S-005/11(2021.01);H01S-005/187(2006.01);H01S-005/02(2006.01);H01S-005/20(2006.01);H01S-005/323(2006.01);H01S-005/042(2006.01);