The invention relates to a method for measuring an antenna pattern (AP) of an antenna (1) on a first flying object (RSS) by means of a second flying object (MES), wherein the first flying object (RSS) moves in orbit along a first elliptical path (EB1) around a celestial body (100) and the second flying object (MES) moves in orbit along a second elliptical path (E2) around the celestial body (100), wherein during the movement of the first and second flying objects (RSS, MES), the antenna (1) emits antenna radiation along a main beam direction (HS) and/or receives antenna radiation from the second flying object (MES), wherein the main beam direction (HS) has a predetermined lateral viewing angle (θ), which is an angle of rotation equal to or unequal to zero about the direction of movement of the first flying object (RSS) relative to the direction to the centre (M) of the celestial body (100), wherein signal values (SV) of the antenna (1) are obtained by means of the second flying object (MES) and at least a part of the antenna pattern (AP) is determined therefrom. In the method according to the invention, the first elliptical path (EB1) and the second elliptical path (EB2) are adjusted relative to each other in such a way that the signal values (SV) obtained during one revolution belong to a fixed predetermined azimuth angle (ξ) and different polar angles (ψ) with respect to the antenna (1), wherein the predetermined azimuth angle (ξ) represents an angle of rotation about the main beam direction (HS) and the different polar angles (ψ) represent angles of inclination relative to the main beam direction (HS).
- 출원번호 : EP2024/062689
- 출원인 : DEUTSCHES ZENTRUM FÜR LUFT- UND RAUMFAHRT E.V.;
- 특허번호 :
- IPC : G01R-029/10(2006.01);G01R-031/00(2006.01);