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  • 511309

    us

    A radiation device is wirelessly connected to a radiography device that generates dynamic image data and which controls sequential radiation. The radiation device includes a signal generator and a first determiner. The signal generator generates (i) first pulse signals emitted by the radiography device, (ii) second pulse signals synchronized with a first count value obtained by counting up the first pulse signals, and (iii) a second count value obtained by counting up the second pulse signals. The first determiner determines whether to start radiation based on a delay time which is a difference between a first time point count value and a second time point count value. The first time point count value indicates a time point at which a radiation permission signal is transmitted. The second time point count value indicates a time point at which the radiation permission signal is received.
    • 출원번호 : 18787201
    • 출원인 : HARA, Kentaro
    • 특허번호 :
    • IPC : A61B-006/00(2006.01);A61B-006/46(2006.01);A61G-003/00(2006.01);
  • 511308

    us

    The present invention relates to a method for applying an image onto a receiving medium, wherein the image is applied onto the recording medium by depositing a UV-curable ink and the ink is irradiated with radiation. The present invention further relates to a scanning printer and a software product.
    • 출원번호 : 18787661
    • 출원인 : Canon Production Printing Holding B.V.
    • 특허번호 :
    • IPC : B41J-011/00(2006.01)
  • 511307

    us

    A method of performing a lithography process includes providing a test pattern. The test pattern includes a first set of lines arranged at a first pitch, a second set of lines arranged at the first pitch, and further includes at least one reference line between the first set of lines and the second set of lines. The test pattern is exposed with a radiation source providing an asymmetric, monopole illumination profile to form a test pattern structure on a substrate. The test pattern structure is then measured and a measured distance correlated to an offset of a lithography parameter. A lithography process is adjusted based on the offset of the lithography parameter.
    • 출원번호 : 18787004
    • 출원인 : Lee, Chih-Jie
    • 특허번호 :
    • IPC : G03F-009/00(2006.01);G03F-007/20(2006.01);
  • 511306

    us

    A method of cleaning a reticle includes applying ozone fluid over a surface of the reticle, and while the ozone fluid is over the surface of the reticle, irradiating the surface of the reticle with ultraviolet (UV) radiation for an irradiation time to treat the surface of the reticle. The method of cleaning the reticle further includes adjusting the irradiation time based on a reflected UV beam from the surface of the reticle.
    • 출원번호 : 18788007
    • 출원인 : Taiwan Semiconductor Manufacturing Company, Ltd.
    • 특허번호 :
    • IPC : G03F-007/00(2006.01)
  • 511305

    wo

    An overlapping wrap-around label for a vessel (200) has: - a sheet-like barrier layer (103), which provides a barrier function for preventing a fluid and/or electromagnetic radiation from passing through, - a main label body (110) of a sheet-like extent, which has a first end side (111), which runs along a first direction (104) and has an overlapping region (108) and a coupling region (109), wherein the overlapping region (108) extends along the first direction (104) and is designed to be applied to the coupling region (109) in an applied state, wherein the coupling region (109) is arranged at a distance from the overlapping region (108) along a second direction (105), and wherein the second direction (105) runs transversely to the first direction (104), and – a reducing structure (101) for narrowing and/or closing at least some sections of a channel (102) that is formed on the first end side (111) in the applied state.
    • 출원번호 : EP2024/071417
    • 출원인 : SCHREINER GROUP GMBH &CO. KG;
    • 특허번호 :
    • IPC : G09F-003/02(2006.01)
  • 511304

    us

    A production method including: a step of forming, on a substrate layer containing a polypropylene resin or a polyester resin, a metal oxide layer by a vacuum film forming process; a step of applying a gas barrier coating layer-forming composition on the metal oxide layer to form a coating film; a step of preheating the coating film by infrared radiation; and a step of heating and thereby curing the coating film preheated by infrared radiation in an atmosphere at 50 to 120° C. to form a gas barrier coating layer, in which the gas barrier coating layer-forming composition contains at least one selected from the group consisting of an alkyl silicon alkoxide and its hydrolysate, and a water-soluble polymer.
    • 출원번호 : 18787875
    • 출원인 : TOPPAN HOLDINGS INC.
    • 특허번호 :
    • IPC : B05D-007/02(2006.01);B05D-003/02(2006.01);B05D-007/00(2006.01);B65D-065/42(2006.01);C23C-014/10(2006.01);C23C-014/24(2006.01);
  • 511303

    us

    An interactive object system includes an interactive object and a source of electromagnetic radiation, e.g., an external source. A power harvesting device of the interactive object receives and harvests power from the electromagnetic radiation to power a special effect system of the interactive object. In an embodiment, the interactive object includes a retroreflective material that reflects electromagnetic radiation, which may be of a same or different wavelength as the electromagnetic radiation from which power is harvested. The interactive object system detects the reflected electromagnetic radiation, which may be used to trigger one or more additional actions related to the interactive object.
    • 출원번호 : 18787756
    • 출원인 : Yeh, Wei Cheng
    • 특허번호 :
    • IPC : G02B-005/126(2006.01);A63G-031/00(2006.01);H02J-050/00(2006.01);H04N-005/33(2006.01);
  • 511302

    us

    A method is provided for ascertaining material information pertaining to a material that is present in a region of interest of an examination subject, including an imaging x-ray device having an x-ray tube assembly, an x-ray detector, and a collimator for collimating an x-ray radiation field of the x-ray tube assembly. The method includes adjusting the collimator to acquire the region of interest only, acquiring a scattered radiation image in the collimator shadow on the x-ray detector, and evaluating the scattered radiation image in order to ascertain the material information.
    • 출원번호 : 18787090
    • 출원인 : Roser, Philipp
    • 특허번호 :
    • IPC : A61B-006/06(2006.01);A61B-006/00(2006.01);A61B-006/42(2006.01);
  • 511301

    us

    The present disclosure relates to parameter optimization. A parameter optimization method may include acquiring an initial exposure parameter usable by the medical device for performing exposure; acquiring contour information of a test subject and initial relative position information of the test subject relative to the examination component; determining an estimated attenuation amount of rays passing through the test subject based on the initial relative position information, contour information of the test subject, and real-time position information of the examination component, the estimated attenuation amount representing the degree of attenuation of rays from the radiation source after passing through the test subject, and the real-time position information of the examination component being position information of the examination component acquired in real time; and updating the initial exposure parameter based on the estimated attenuation amount. The method can reduce the number of exposures and improve the operating procedure and efficiency.
    • 출원번호 : 18786728
    • 출원인 : Siemens Healthineers AG
    • 특허번호 :
    • IPC : A61B-006/00(2006.01);A61B-006/40(2006.01);G06T-007/00(2006.01);G06T-017/00(2006.01);
  • 511300

    us

    A method, an apparatus and a system for evaluating the performance of an electromagnetic radiation device are disclosed. According to an embodiment of a present disclosure, a performance evaluation system includes a power source, an impedance matching circuit, the electromagnetic radiation electrode and a phantom that simulates a subject which is a target of electromagnetic wave irradiation. The performance evaluation system also includes an instrument for measuring the power of the power source, a first power inside the phantom, and a first electric field inside the phantom. The performance evaluation system also includes an analysis device for calculating a power radiated to the phantom and evaluating performance of an electromagnetic radiation device using at least one of the power radiated to the phantom, a second power inside the phantom, and a second electric field inside the phantom.
    • 출원번호 : 18787916
    • 출원인 : LEE, Kwang Jae
    • 특허번호 :
    • IPC : G01R-029/08(2006.01)