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  • 505114

    us

    A method of manufacturing a semiconductor device includes forming a first protective layer over an edge portion of a first main surface of a semiconductor substrate. A metal-containing photoresist layer is formed over the first main surface of the semiconductor substrate. The first protective layer is removed, and the metal-containing photoresist layer is selectively exposed to actinic radiation. A second protective layer is formed over the edge portion of the first main surface of the semiconductor substrate. The selectively exposed photoresist layer is developed to form a patterned photoresist layer, and the second protective layer is removed.
    • 출원번호 : 18656987
    • 출원인 : Taiwan Semiconductor Manufacturing Company, Ltd.
    • 특허번호 :
    • IPC : H01L-021/027(2006.01);H01L-021/67(2006.01);
  • 505113

    us

    A device for forming spatial light distributions based on a waveguiding component containing an array of diffractive regions is described. The waveguide-based light emitting module has reduced size and weight as compared to light emitting modules with traditional optical elements. Compared to traditional light emitting modules, the exit aperture of the waveguide light emitting module is composed of sub-aperture regions that out-couple light and direct the emitted radiation at different angles.
    • 출원번호 : 18657457
    • 출원인 : Soskind, Yakov
    • 특허번호 :
    • IPC : G02B-006/42(2006.01)
  • 505112

    us

    Provided are a cooperative polarization skylight background radiation measurement device and method, belonging to the field of polarized radiation remote sensing. The device includes a measurement probe, a lower computer control system, a two-dimensional turntable, a base and data transmission interface, as well as an upper computer. The method includes the following steps: the cooperative skylight background radiation polarization measurement device is initialized, a polarization wheel is returned to a zero position, and dark noise is collected by a double-path spectrometer; then a measurement mode is selected for measurement; and finally, spectral polarization data of each wave band acquired by the double-path spectrometer and a division-of-focal plane polarization camera is transmitted to the upper computer through a data line, original spectral light intensity data is calculated according to a measurement principle, and finally a degree of polarization and an azimuth angle of polarization are obtained.
    • 출원번호 : 18656937
    • 출원인 : Hefei Institutes of Physical Science, CAS
    • 특허번호 : 12135277
    • IPC : G01N-021/21(2006.01);G01N-021/25(2006.01);G01N-021/27(2006.01);G01N-021/3581(2014.01);G01J-003/02(2006.01);G01J-003/447(2006.01);G01J-004/00(2006.01);G01N-021/47(2006.01);
  • 505111

    us

    A system, method, and air purification device. Air is taken in from an environment into the air purification system. The air is treated with vacuum ultraviolet radiation in a first reaction chamber to generate irradiated air. The irradiated air is treated with ultraviolet-C radiation in a secondary reaction chamber to generate purified air. The purified air is emitted back into the environment from the air purification system.
    • 출원번호 : 18657489
    • 출원인 : AtmenBio, LLC
    • 특허번호 :
    • IPC : A61B-090/40(2006.01);A61L-009/03(2006.01);A61L-009/20(2006.01);
  • 505110

    us

    Optical elements that efficiently propagate x-ray radiation over a desired energy range and reject radiation outside the desired energy range are presented herein. In one aspect, one or more optical elements of an x-ray based system include an integrated optical filter including one or more material layers that absorb radiation having energy outside the desired energy band. In general, the integrated filter improves the optical performance of an x-ray based system by suppressing reflectivity within infrared (IR), visible (vis), ultraviolet (UV), extreme ultraviolet (EUV) portions of the spectrum, or any other undesired wavelength region. In a further aspect, one or more diffusion barrier layers prevent degradation of the integrated optical filter, prevent diffusion between the integrated optical filter and other material layers, or both. In some embodiments, the thickness of one or more material layers of an integrated optical filter vary over the spatial area of the filter.
    • 출원번호 : 18657427
    • 출원인 : Kuznetsov, Alexander
    • 특허번호 :
    • IPC : G01N-023/20008(2006.01);G01N-023/201(2006.01);G21K-001/06(2006.01);G21K-001/10(2006.01);
  • 505109

    wo

    Disclosed is an illumination configuration module comprising: a radiation modulation device being operable to receive spectrally dispersed broadband input radiation on an active area and to selectively diffract a diffracted fraction of said spectrally dispersed broadband input radiation to obtain spectrally configured radiation comprising desired diffracted radiation and nuisance diffracted radiation; and at least one spectral filter operable to substantially block a spectral portion of said spectrally configured radiation, the spectral portion comprising said nuisance diffracted radiation.
    • 출원번호 : EP2024/062566
    • 출원인 : ASML NETHERLANDS B.V.
    • 특허번호 :
    • IPC : G03F-007/00(2006.01);G03F-009/00(2006.01);G02B-005/18(2006.01);G02B-005/20(2006.01);G02B-026/08(2006.01);G02B-027/10(2006.01);
  • 505108

    wo

    A method of selectively releasing CO from a CO loaded solid sorbent includes: applying an electromagnetic radiation having an intensity of greater than or equal to 0.7 watt per square centimeter and a frequency of about 400 terahertz to about 70 kilohertz to the CO loaded solid sorbent to release CO; wherein the CO loaded solid sorbent comprises chemisorbed CO, physisorbed CO, or a combination thereof, and a solid sorbent; and the solid sorbent comprises at least one amine compound.
    • 출원번호 : US2024/028139
    • 출원인 : MOSAIC MATERIALS, INC.
    • 특허번호 :
    • IPC : B01D-053/04(2006.01)
  • 505107

    wo

    The invention relates to a microwave treatment device (10), the microwave treatment device (10) comprising: - a primary module (100) that extends from a base towards a primary end (102) along an axis of elongation XX', the generating module being configured to emit a jet of plasma through which a microwave field propagates via an opening (105) arranged in the primary end (102) thereof; - an advantageously essentially planar metal grid (500) having an extent S, which advantageously essentially planar metal grid is coupled to the primary module (100) such that, when the primary module (100) is in operation, the plasma jet reaches the metal grid (500) and the microwave radiation emitted by the primary module (100) is absorbed by the metal grid (500) which uniformly re-emits the radiation over the entire extent thereof.
    • 출원번호 : EP2024/062469
    • 출원인 : POSTEL-HOLDING
    • 특허번호 :
    • IPC : H05H-001/30(2006.01);H05H-001/46(2006.01);A61N-001/44(2006.01);
  • 505106

    wo

    In a method for operating a baking oven with at least one radiation heating device in a muffle, a food support for placing food for heat treatment in the muffle, a temperature sensor in the muffle and a baking oven control unit, the baking oven control unit determines the energy generated by the heating device, and determines the temperature detected by the temperature sensor and the temperature of the heating device. The baking oven control unit will then determine the influence of a radiation heat flow emanating directly from the heating device on the food on the basis of stored values, and determines the influence of the convection heat flow based on the temperature measured by the temperature sensor. The baking oven control unit also determines the temperature of the upper side of the food, and will then regulate the power of the heating device on the basis of a comparison between the preset temperature and the determined temperature at the food to be cooked in order to bring the determined temperature at the food to the preset temperature.
    • 출원번호 : EP2024/062410
    • 출원인 : E.G.O. ELEKTRO-GERÄTEBAU GMBH;
    • 특허번호 :
    • IPC : F24C-007/08(2006.01)
  • 505105

    wo

    An inspection system (100) is configured to detect and analyse matter (2), comprising an irradiation arrangement (101) for emitting optical radiation for irradiating said matter (2), a detector system (110) with at least one detector (120) adapted to receive and detect optical radiation, a white reference target element (19), and a switching element (11) comprising at least one inspection zone (12), at least one dark reference zone (13) and at least one white reference zone (14). The switching element (11) is rotatable between at least one inspection position, in which said inspection zone (12) transmits optical radiation originating from said matter (2) towards said detector system (110), at least one dark reference position, in which said switching element (11) blocks at least most of the optical radiation originating from said matter (2) from reaching said detector system (110) and said dark reference zone (13) faces said at least one detector (120), and at least one white reference position, in which said switching element (11) blocks at least most of the optical radiation originating from said matter (2) from reaching said detector system (110) and said white reference zone (14) redirects and transmits optical radiation originating from said white reference target element (19) towards said detector system (110).
    • 출원번호 : EP2024/062471
    • 출원인 : TOMRA SORTING GMBH
    • 특허번호 :
    • IPC : G01N-021/27(2006.01);G01N-021/31(2006.01);G01N-021/85(2006.01);G01N-021/88(2006.01);G01N-021/93(2006.01);B07C-005/00(2006.01);G01N-021/33(2006.01);G01N-021/3563(2014.01);G01N-021/359(2014.01);G01N-021/90(2006.01);