An apparatus for non-contact measuring temperature comprises: a stand, for securing a vapor chamber, wherein the vapor chamber comprises a condenser area and an evaporator area, wherein the evaporator area comprises a heating spot; a continuous-wave laser device, facing the stand, for irradiating the heating spot by providing a visible laser beam, wherein the visible laser beam comprises a visible wavelength range; a switch device, controlling an irradiating cycle of the visible laser beam, wherein the irradiating cycle comprises a irradiating time-interval and a non-irradiating time-interval; a first infrared sensor, facing the stand, for collecting a first thermal radiation data of the heating spot in a second infrared wavelength range; a data processing unit, only transferring the first thermal radiation data in the non-irradiating time-interval into a first temperature, wherein the irradiating time-interval is longer than the non-irradiating time-interval.
- 출원번호 : 19294184
- 출원인 : Hsiao, Ming-Hsien
- 특허번호 :
- IPC : G01J-005/00(2022.01);F28D-015/06(2006.01);G01J-005/08(2022.01);