A bottled water dispenser with a system for treating water in a bottle with UV radiation, containing a water intake finger equipped with a source of UV radiation and configured to open the bottle sealed by a cap by pushing a valve installed in the centre of the cap inside to the bottle or by rupturing this valve, wherein a semiconductor LED is used as the source of UV radiation, the semiconductor LED is installed in a recess made at the end face of the water intake finger, so that when the bottle is opened with the water intake finger, the source is inside the bottle, and the radiation of the source is directed towards the water surface and towards the walls of the bottle, and wherein the semiconductor LED is protected by a quartz glass covering the recess.

• 출원번호 : 19392037
• 출원인 : Scandinavian Innovation Group Oy
• 특허번호 :
• IPC : C02F-001/32(2023.01);B67D-003/00(2006.01);

The present application is directed to devices, assemblies, systems and methods for targeting one or more sites with electromagnetic radiation. The devices, assemblies and systems are operationally configured to transform and convey electromagnetic radiation to one or more targeted sites. The devices, assemblies and systems may also convey one or more fluids or fluid solutions to the one or more targeted sites.

• 출원번호 : 19390460
• 출원인 : ROGERS, CHARLES BRIAN
• 특허번호 :
• IPC : A61N-005/06(2006.01);A61B-018/00(2006.01);A61B-018/20(2006.01);A61B-018/24(2006.01);

A radiation shield assembly is described, configured to block radiation emanating from a radiation source from reaching a user. Two shields are supported by a support arm, and are configured to rotate and translate relative to one another about the support arm's longitudinal axis. This allows the shield to be easily configured and reconfigured as necessary to visualize various parts of a patient's body via radiography.

• 출원번호 : 19390454
• 출원인 : FOSTER, Robert Evans
• 특허번호 :
• IPC : A61B-006/10(2006.01);G21F-003/00(2006.01);

The processing of radiation patternable organometallic coatings is shown to be improved through the appropriate selection of post processing conditions between coating and development of the pattern. In particular, a coated wafer can be subjected to process delays to allow aging of the coating at various process points, in particular following irradiation. Process delays can be combined and interspersed with heating steps. The atmosphere above the coated wafer at various process steps can be adjusted to obtain desired improvements in the development of the pattern. Reactive gases can be beneficial with respect to improvement of coating properties.

• 출원번호 : 19390111
• 출원인 : Telecky, Alan J.
• 특허번호 :
• IPC : G03F-007/38(2006.01);G03F-007/004(2006.01);

A radiation shield assembly is described, configured to block radiation emanating from a radiation source from reaching a user. Two shields are supported by a support arm, and are configured to rotate and translate relative to one another about the support arm's longitudinal axis. This allows the shield to be easily configured and reconfigured as necessary to visualize various parts of a patient's body via radiography.

• 출원번호 : 19390467
• 출원인 : FOSTER, Robert Evans
• 특허번호 :
• IPC : A61B-006/10(2006.01);G21F-003/00(2006.01);

An image processing apparatus is provided that includes: an obtaining unit is configured to obtain a first radiation image of an object to be examined; and a generating unit configured to, by inputting the first radiation image obtained by the obtaining unit into a learned model, generate a second radiation image in which noise is reduced compared to the first radiation image, wherein the learned model is obtained by training using training data that includes a radiation image obtained by adding noise with attenuated high-frequency components.

• 출원번호 : 19387844
• 출원인 : KOBAYASHI, Tsuyoshi
• 특허번호 :
• IPC : G06T-005/70(2024.01);G06T-005/50(2006.01);

A radiation imaging apparatus includes a radiation detector configured to convert incident radiation into an electric signal regarding a radiation image, at least one power reception unit configured to receive power from outside, and a housing containing the radiation detector and the power reception unit, the housing includes a thick portion and a thin portion integrated together in an internal space, and a panel portion of the radiation detector and the power reception unit are placed in the thin portion.

• 출원번호 : 19388529
• 출원인 : FUKUSHIMA, TAKASHI
• 특허번호 :
• IPC : G01T-001/20(2006.01);A61B-006/00(2024.01);G01K-003/00(2006.01);H02J-050/10(2016.01);H02J-050/70(2016.01);H02J-050/80(2016.01);H02J-050/90(2016.01);

A radar fill level measuring device for detecting the level of a medium with low permittivity located in a container is shown and described, with a feed and receiving element arranged outside the container for generating and receiving electromagnetic radiation, with a measuring window in the wall of the container that is permeable to electromagnetic radiation, with a waveguide arranged in the container and extending over a level measurement range. The waveguide can be flooded by the medium. The feed and receiving element, the measuring window and the waveguide form a measuring path over which, during measuring operation, electromagnetic radiation generated by the feed and receiving element propagates through the measuring window and through the waveguide during measurement operation. Electromagnetic radiation reflected from a medium surface in the waveguide is guided back through the waveguide and through the measuring window to the feed and receiving element.

• 출원번호 : 19386710
• 출원인 : KROHNE Messtechnik GmbH
• 특허번호 :
• IPC : G01F-023/284(2006.01);H01Q-001/22(2006.01);H01Q-015/14(2006.01);H01Q-015/24(2006.01);

A method of manufacturing a semiconductor device includes forming a first protective layer over an edge portion of a first main surface of a semiconductor substrate. A metal-containing photoresist layer is formed over the first main surface of the semiconductor substrate. The first protective layer is removed, and the metal-containing photoresist layer is selectively exposed to actinic radiation. A second protective layer is formed over the edge portion of the first main surface of the semiconductor substrate. The selectively exposed photoresist layer is developed to form a patterned photoresist layer, and the second protective layer is removed.

• 출원번호 : 19386860
• 출원인 : Taiwan Semiconductor Manufacturing Company, Ltd.
• 특허번호 :
• IPC : H01L-021/027(2006.01);H01L-021/67(2006.01);

개시되는 가이거 뮐러 튜브형 휴대용 방사선 측정 장치에 적용되는 검출 부재 결합 유닛에 의하면, 제 1 케이스부 및 제 2 케이스부를 포함하고, 상기 제 2 케이스부가 제 2 케이스 몸체와, 검출측 결합 몸체와, 몸체 연결부와, 몸체 격벽과, 검출측 고정부와, 몸체 연통홀을 포함하고, 상기 가이거 뮐러 튜브형 휴대용 방사선 측정 장치를 구성하는 검출 부재가 상기 검출측 결합 몸체에 삽입되는 형태로 결합되고, 상기 검출측 고정부에 의해 위치가 고정됨에 따라, 상기 검출 부재가 상기 검출측 결합 몸체의 내부에서 견고하게 결합되어 휴대 시 임의로 흔들리는 현상이 방지될 수 있게 되는 장점이 있다.또한, 상기 가이거 뮐러 튜브형 휴대용 방사선 측정 장치에 적용되는 검출 부재 결합 유닛이 상기 방사선 필터 부재를 더 포함함에 따라 하나의 상기 검출 부재가 하나의 상기 검출 부재 결합 유닛에 결합된 상태에서 여러 종류의 방사선을 선택적으로 측정할 수 있게 되는 장점이 있다.

• 출원번호 : 10-2025-0170613
• 출원인 : (주)일진라드
• 특허번호 : 10-2942945-0000
• IPC : G01T-001/18;G01T-001/02;G01T-007/04;