A radiation detector head assembly includes a detector column including a detector having a first surface and a second surface opposite the first surface. The detector column includes a first collimator disposed over the first surface of the detector and a second collimator disposed over the second surface of the detector. The detector column includes a first radiation shield disposed over the first collimator, wherein the first radiation shield includes a first recess for receiving the first collimator and a first opening over a third surface of the first collimator, the third surface being opposite the first surface of the detector. The detector column includes a second radiation shield disposed over the second collimator, wherein the second radiation shield includes a second recess for receiving the second collimator and a second opening over a fourth surface of the second collimator, the fourth surface being opposite the second surface.

• 출원번호 : 18749379
• 출원인 : Shtern, Asaf
• 특허번호 :
• IPC : A61B-006/42(2006.01)

A device includes a scattering structure and a collection structure. The scattering structure is arranged to concurrently scatter incident electromagnetic radiation along a first scattering axis and along a second scattering axis. The first scattering axis and the second scattering axis are non-orthogonal. The collection structure includes a first input port aligned with the first scattering axis and a second input port aligned with the second scattering axis. A method includes scattering electromagnetic radiation along a first scattering axis to create first scattered electromagnetic radiation and along a second scattering axis to create second scattered electromagnetic radiation. The first scattering axis and the second scattering axis are non-orthogonal. The first scattered electromagnetic radiation is detected to yield first detected radiation and the second scattered electromagnetic radiation is detected to yield second detected radiation. The first detected radiation is phase aligned with the second detected radiation.

• 출원번호 : 18748746
• 출원인 : JOU, Chewn-Pu
• 특허번호 :
• IPC : G01J-001/04(2006.01);G01J-001/42(2006.01);G01J-001/44(2006.01);G02B-006/42(2006.01);

Photosensitive devices and associated methods are provided. In one aspect, for example, a photosensitive imager device can include a semiconductor substrate having multiple doped regions forming at least one junction, a textured region coupled to the semiconductor substrate and positioned to interact with electromagnetic radiation, and an electrical transfer element coupled to the semiconductor substrate and operable to transfer an electrical signal from the at least one junction. In one aspect, the textured region is operable to facilitate generation of an electrical signal from the detection of infrared electromagnetic radiation. In another aspect, interacting with electromagnetic radiation further includes increasing the semiconductor substrate's effective absorption wavelength as compared to a semiconductor substrate lacking a textured region.

• 출원번호 : 18749227
• 출원인 : SiOnyx, LLC
• 특허번호 :
• IPC : H01L-027/146(2006.01)

A system is configured to evaluate a semiconductor device. The system is for irradiating a test target semiconductor device arranged on a test board with a radiation test beam to measure an error value of the test target semiconductor device, wherein the test target semiconductor device includes a reference test target semiconductor device and a general test target semiconductor device, the system for evaluating the semiconductor device derives a reference error value of the reference test target semiconductor device and a reference error value of the general test target semiconductor device, and the reference error value of the general test target semiconductor device is able to be defined as a relative ratio to the reference error value of the reference test target semiconductor device.

• 출원번호 : 18748924
• 출원인 : QRT Co., Ltd.
• 특허번호 :
• IPC : G01R-031/302(2006.01)

The disclosure is directed to devices for use in radiation therapy. Various configurations of shielding materials within shielding layers, such as for use in shielding radiation from radioactive sources within implanted radioactive carriers, are discussed herein.

• 출원번호 : 18747335
• 출원인 : Brachman, David
• 특허번호 :
• IPC : A61N-005/10(2006.01);G21F-003/00(2006.01);

The present disclosure relates to the technical field of hair dryers, and in particular, to a high-efficiency heating module applied to a hair dryer. The heating module includes a shell body with two run-through ends, an insulation bracket mounted in the shell body, and a heating main body fixedly mounted on the insulation bracket. The heating main body includes a heat conduction portion and a heating portion; the heat conduction portion includes a heat radiation inner cylinder, at least one layer of honeycomb-shaped heat radiation plate enclosed on an outer side of the heat radiation inner cylinder, and an outer heat radiation plate enclosed outside the outermost layer of honeycomb-shaped heat radiation plate; the heating portion includes a first heating film and a second heating film.

• 출원번호 : 18746397
• 출원인 : Jiang, Junmin
• 특허번호 :
• IPC : A45D-020/08(2006.01)

An image processing apparatus includes at least one processor, in which the at least one processor is configured to: detect calcification from a radiation image obtained by imaging a breast by irradiating the breast with radiation; generate a low resolution image from a calcification distribution image representing a detection result of the calcification by reducing a resolution to be lower than a resolution of the radiation image; and determine a type of a distribution state of the calcification based on the low resolution image.

• 출원번호 : 18747369
• 출원인 : MACHII, Yusuke
• 특허번호 :
• IPC : G06T-007/00(2006.01);G06T-003/40(2006.01);

A fabric (30) includes a first flexible fabric layer (32), having fabric emissivity properties in a visible radiation range that are selected so as to mimic ambient emissivity properties of a deployment environment of the fabric, and at least one second flexible fabric layer (34), which is joined to the first flexible fabric layer, and which is configured to scatter long-wave radiation that is incident on the fabric. The first and second flexible fabric layers are perforated by a non-uniform pattern of perforations (44) extending over at least a part of the fabric.

• 출원번호 : 18746170
• 출원인 : Morag, Elad
• 특허번호 :
• IPC : B32B-038/00(2006.01);B32B-003/26(2006.01);B32B-005/26(2006.01);F41H-003/00(2006.01);

The actinic ray-sensitive or radiation-sensitive resin composition includes a resin, and an ionic compound having, in at least one of a cationic moiety or an anionic moiety, a group represented by —SF4R provides a very good pattern profile in the formation of an ultrafine pattern such as a line-and-space pattern of 25 nm or less, and a hole pattern having a hole diameter of 25 nm or less.

• 출원번호 : 18746861
• 출원인 : FUJIFILM Corporation
• 특허번호 :
• IPC : G03F-007/004(2006.01);C07C-043/29(2006.01);C07C-062/24(2006.01);C07C-063/70(2006.01);C07C-065/10(2006.01);C07C-233/91(2006.01);C07C-309/12(2006.01);C07C-309/19(2006.01);C07C-311/09(2006.01);C07C-311/48(2006.01);C07C-311/51(2006.01);C07C-323/09(2006.01);C07C-381/12(2006.01);C07D-327/06(2006.01);C07D-333/54(2006.01);C07D-333/76(2006.01);

A system identifying a source of radiation is provided. The system includes a radiation source detector and a radiation source identifier. The radiation source detector receives measurements of radiation; for one or more sources, generates a detection metric indicating whether that source is present in the measurements; and evaluates the detection metrics to detect whether a source is present in the measurements. When the presence of a source in the measurements is detected, the radiation source identifier for one or more sources, generates an identification metric indicating whether that source is present in the measurements; generates a null-hypothesis metric indicating whether no source is present in the measurements; evaluates the one or more identification metrics and the null-hypothesis metric to identify the source, if any, that is present in the measurements.

• 출원번호 : 18747014
• 출원인 : Labov, Simon E.
• 특허번호 :
• IPC : G01V-005/26(2006.01);G01T-001/167(2006.01);G01T-001/36(2006.01);G01V-005/20(2006.01);