Disclosed are methods of curing a composition comprising (a) an epoxy-containing compound and (b) an amine-containing compound and/or a thiol-containing compound. The method includes exposing the composition to electromagnetic radiation generated by a laser to cure the composition. Also disclosed are substrates comprising a coating cured by any of the methods disclosed herein.

• 출원번호 : US2025/043840
• 출원인 : PPG INDUSTRIES OHIO, INC.
• 특허번호 :
• IPC : C08G-018/10(2006.01);C08G-018/24(2006.01);C08G-018/36(2006.01);C08G-018/48(2006.01);C08G-018/62(2006.01);C08G-018/79(2006.01);C08G-018/80(2006.01);C09D-175/04(2006.01);C09D-175/08(2006.01);B05D-003/06(2006.01);

Disclosed are methods of curing a composition. The method includes exposing the composition to electromagnetic radiation generated by a laser for a period of time sufficient to cure the composition. The composition may include an isocyanate-containing compound and an active hydrogen-containing compound. Also disclosed are substrates comprising a coating formed from a coating cured by any of the methods disclosed herein.

• 출원번호 : US2025/043860
• 출원인 : PPG INDUSTRIES OHIO, INC.
• 특허번호 :
• IPC : C08G-018/10(2006.01);C08G-018/24(2006.01);C08G-018/36(2006.01);C08G-018/48(2006.01);C08G-018/62(2006.01);C08G-018/79(2006.01);C08G-018/80(2006.01);C09D-175/04(2006.01);C09D-175/08(2006.01);B05D-003/06(2006.01);

Disclosed are methods of curing a powder coating composition. The method includes exposing the powder coating composition to electromagnetic radiation generated by a laser for a period of time sufficient to cure the powder coating composition. The powder coating composition may include a resin, a crosslinker, and a photothermally active material. Also disclosed are substrates comprising a coating formed from the powder coating composition cured by the disclosed methods.

• 출원번호 : US2025/043967
• 출원인 : PPG INDUSTRIES OHIO, INC.
• 특허번호 :
• IPC : B05D-003/06(2006.01)

Methods for interferometrically determining the surface shape of a test object. In one aspect, in the test arrangement (100) a test wave, generated from electromagnetic radiation and reflected from the test object (110), is overlaid with a reference wave, which is split in reflection from the test wave at a reference surface (121) of a reference element (120) before this test wave hits the test object. The test object is designed for installation in a predefined installation position in an optical system (700). The reference surface is designed based on a measurement previously carried out on the reference element in a predefined installation position in a measuring system (800). The surface shape of the test object in the test arrangement is determined taking account of both the installation position of the test object in the optical system (700) and the installation position of the reference element in the measuring system.

• 출원번호 : 19312370
• 출원인 : PATRA, Michael
• 특허번호 :
• IPC : G01B-011/24(2006.01);G03F-007/00(2006.01);

A level sensor is an optical sensor that measures the height of a substrate surface. The field of view of a level sensor limits the sensor's per substrate measurement time (e.g., throughput). An enhanced level sensor with a larger field of view and faster throughput is described. The enhanced level sensor incorporates a projection grating comprising sub-fields configured to separately pattern different portions of radiation that is projected onto the substrate surface. Projection optics comprising a series of mirrors direct the different portions of the radiation onto the substrate surface in a colinear arrangement or a parallel arrangement. This doubles the size of the field of view of the level sensing system compared to prior systems, significantly reduces a total required measurement time for each substrate, and/or has other advantages.

• 출원번호 : EP2025/074487
• 출원인 : ASML NETHERLANDS B.V.
• 특허번호 :
• IPC : G03F-009/00(2006.01)

A system configured to reduce scatter radiation around a surgical table during a medical procedure that may include at least one radiation shield configured to be connected to a surgical table with an attachment mechanism, wherein the at least one radiation shield includes one or more adjustable radiation shield segments coupled or releasably coupled to the at least one radiation shield. A device may include a pump in fluid communication with the one or more adjustable radiation shield segments comprising a pneumatic channel that is configured to at least partially inflate the pneumatic channel such that at least a first portion of the at least one radiation shield extends vertically above at least a portion of the surgical table, wherein a second portion of radiation shield is configured to extend below the surgical table. A device may include a controller configured to activate the pump.

• 출원번호 : US2025/044047
• 출원인 : SALUS SCIENTIFIC CORP.
• 특허번호 :
• IPC : A61B-006/10(2006.01);A61B-006/04(2006.01);A61B-006/42(2024.01);G21F-001/12(2006.01);G21F-003/00(2006.01);G21F-001/08(2006.01);

A radiation imaging apparatus that images a radiation image includes a radiation detector that includes a substrate and a semiconductor element that is formed on an imaged surface of the substrate; a supporter that supports the radiation detector, a battery that supplies power to the radiation imaging apparatus through a terminal; a case that includes a front surface portion facing the imaging surface of the radiation detector and a rear surface portion facing the front surface portion with the radiation detector in between; and a connector that is provided on a lateral surface of the case and that communicates with an external device. The battery is provided so that the terminal thereof projects in a direction perpendicular to the side of the case where the connector is provided.

• 출원번호 : 19313068
• 출원인 : KONICA MINOLTA, INC.
• 특허번호 :
• IPC : G01T-001/24(2006.01)

An air conditioner control device of an embodiment includes: illuminance acquisition unit; a heat load acquisition unit; a target zone determination unit; and a derivation unit. The illuminance acquisition unit is configured to acquire illuminance measured by a user terminal. The heat load acquisition unit is configured to estimate an amount of solar radiation from the acquired illuminance and acquire a heat load from the estimated amount of solar radiation. The target zone determination unit is configured to determine whether or not a target zone including a location where the user terminal measures the illuminance is a perimeter zone. The derivation unit is configured to derive a correction value for a set temperature of the air conditioner in accordance with a determination result of the target zone determination unit and the acquired heat load.

• 출원번호 : 19313336
• 출원인 : Carrier Japan Corporation
• 특허번호 :
• IPC : F24F-011/63(2018.01);F24F-130/20(2018.01);

The invention relates to a VCSEL (10), which has an electrically pumpable laser emission region (12) for generating laser radiation which is emitted in a laser emission direction (z). The electrically pumpable laser emission region (12) has a length (L) in a first dimension (x) in a plane perpendicular to the laser emission direction (z), and a width (B) in a second dimension (y) perpendicular to the first dimension (x), wherein the length (L) is greater than the width (B) at least by a factor of two. In order to improve the performance of the VCSEL (10), the width (B, B) in a longitudinal end region of the laser emission region (12), which longitudinal end region is located on one side of a central region of the laser emission region (12) in the direction of the first dimension (x), is greater than the width (B) in the central region.

• 출원번호 : EP2025/074346
• 출원인 : TRUMPF PHOTONIC COMPONENTS GMBH
• 특허번호 :
• IPC : H01S-005/183(2006.01);H01S-005/024(2006.01);H01S-005/062(2006.01);

The present invention relates to additive manufacturing arrangements and methods for additive manufacturing by selective fusion of layers of a three-dimensional product from a powder bed (240) comprising successively formed powder layers. An electron beam emitter (210) is configured to deliver an electron beam (220) towards a top surface (242) of the powder bed (240) and at least one detector (285) is configured to detect electron and/or photon radiation from a structure (291, 292) of a vacuum chamber (280) or inner surface (291, 292) of the vacuum chamber (280). An analysing unit (294) is configured to use the output signal from the at least one detector (285) to analyse the radiation distribution in the output signal to determine a resulting signal indicating a melt status of the melt pool and an electron beam controller (296) is configured to control the energy beam (220) in response to the resulting signal.

• 출원번호 : EP2025/074404
• 출원인 : FREEMELT AB
• 특허번호 :
• IPC : B33Y-030/00(2015.01);B22F-010/28(2021.01);B22F-010/36(2021.01);B22F-010/85(2021.01);B22F-012/41(2021.01);B22F-012/90(2021.01);B33Y-010/00(2015.01);B33Y-050/02(2015.01);G01N-023/22(2018.01);B23K-015/00(2006.01);B23K-015/06(2006.01);