A circuit for testing power source conduction of a plasma ball lamp. The circuit is connected to an alternating-current output end of an external power source; and the circuit comprises a rectifying circuit (1) and a switch power source (2), wherein one end of the rectifying circuit (1) is connected to the alternating-current output end of the external power source, and the other end thereof is connected to the switch power source (2); the rectifying circuit (1) is used for converting an alternating current, which is output by the alternating-current output end, into a direct current and outputting the direct current to the switch power source (2); and the rectifying circuit (1) comprises at least two diodes and a substrate, each diode being integrated on the substrate. The present application has the effects of being high in terms of integration level, low in terms of cost and capable of improving the conduction and radiation performance of a testing circuit, and the circuit in the present application can also be used for other devices and can be used as a power adapter or a charger.
- 출원번호 : CN2024/109197
- 출원인 : CHANGZHOU SHENGDAN ELECTRICAL EQUIPMENT CO., LTD.
- 특허번호 :
- IPC : G01R-031/00(2006.01);G01R-031/40(2020.01);